Cresswell, Richard G.: search on Z-Library

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1

Early Human Occupation at Devil's Lair, Southwestern Australia 50,000 Years Ago

Chris S.M. Turney, Michael I. Bird, L.Keith Fifield, Richard G. Roberts, Mike Smith, Charles E. Dortch, Rainer Grün, Ewan Lawson, Linda K. Ayliffe, Gifford H. Miller, Joe Dortch, Richard G. Cresswell

Journal:

Quaternary Research

Year:

2001

Language:

english

File:

PDF, 322 KB

english, 2001

2

The efficacy of SMART Arm training early after stroke for stroke survivors with severe upper limb disability: a protocol for a randomised controlled trial

Sandra G Brauer, Kathryn S Hayward, Richard G Carson, Andrew G Cresswell…

Journal:

Year:

2013

Language:

english

File:

PDF, 222 KB

english, 2013

3

Process optimization for lattice-selective wet etching of crystalline silicon structures

Dixson, Ronald G., Guthrie, William F., Allen, Richard A., Orji, Ndubuisi G., Cresswell, Michael W., Murabito, Christine E.

Journal:

Journal of Micro/Nanolithography MEMS and MOEMS

Year:

2016

Language:

english

File:

PDF, 1.46 MB

english, 2016

4

Transmission electron microscope calibration methods for critical dimension standards

Orji, Ndubuisi G., Dixson, Ronald G., Garcia-Gutierrez, Domingo I., Bunday, Benjamin D., Bishop, Michael, Cresswell, Michael W., Allen, Richard A., Allgair, John A.

Journal:

Journal of Micro/Nanolithography MEMS and MOEMS

Year:

2016

Language:

english

File:

PDF, 2.71 MB

english, 2016

5

Robust auto-alignment technique for orientation-dependent etching of nanostructures

McGray, Craig D., Kasica, Richard, Orji, Ndubuisi G., Dixson, Ronald, Cresswell, Michael W., Allen, Richard A., Geist, Jon

Journal:

Journal of Micro/Nanolithography MEMS and MOEMS

Year:

2012

Language:

english

File:

PDF, 3.22 MB

english, 2012

6

Xpert MTB/RIF Ultra for the diagnosis of HIV-associated tuberculous meningitis: a prospective validation study

Cresswell, Fiona V, Tugume, Lillian, Bahr, Nathan C, Kwizera, Richard, Bangdiwala, Ananta S, Musubire, Abdu K, Rutakingirwa, Morris, Kagimu, Enock, Nuwagira, Edwin, Mpoza, Edward, Rhein, Joshua, Willi

Journal:

The Lancet Infectious Diseases

Year:

2020

Language:

english

File:

PDF, 871 KB

english, 2020

7

Tuberculosis in HIV-Associated Cryptococcal Meningitis is Associated with an Increased Risk of Death

Rutakingirwa, Morris K., Cresswell, Fiona V., Kwizera, Richard, Ssebambulidde, Kenneth, Kagimu, Enock, Nuwagira, Edwin, Tugume, Lillian, Mpoza, Edward, Dobbin, Joanna, Williams, Darlisha A., Muzoora,

Journal:

Journal of Clinical Medicine

Year:

2020

Language:

english

File:

PDF, 513 KB

english, 2020

8

The Human Revolution [and Comments and Reply]

Hockett, Charles F., Ascher, Robert, Agogino, George A., Birdwhistell, Ray L., Bryan, Alan Lyle, Clark, J. Desmond, Coon, Carleton S., Count, Earl W., Cresswell, Robert, Diebold,, A. Richard, Dobzhans

Journal:

Current Anthropology

Year:

1964

Language:

english

File:

PDF, 6.28 MB

english, 1964

9

Framework for participative reflection on the accomplishment of transdisciplinary research programs

Dirk J. Roux, Richard J. Stirzaker, Charles M. Breen, E.C. Lefroy, Hamish P. Cresswell

Journal:

Environmental Science & Policy

Year:

2010

Language:

english

File:

PDF, 182 KB

english, 2010

10

Age constraints on Pleistocene megafauna at Tight Entrance Cave in southwestern Australia

Linda K. Ayliffe, Gavin J. Prideaux, Michael I. Bird, Rainer Grün, Richard G. Roberts, Grant A. Gully, Rhys Jones, L. Keith Fifield, Richard G. Cresswell

Journal:

Quaternary Science Reviews

Year:

2008

Language:

english

File:

PDF, 785 KB

english, 2008

11

Comparison of the effects of keto acid analogues and essential amino acids on nitrogen homeostasis in uremic patients on moderately protein-restricted diets

Burns, J, Cresswell, E, Ell, S, Fynn, M, Jackson, M A, Lee, H A, Richards, P, Rowlands, A, Talbot, S

Journal:

American Journal of Clinical Nutrition

Year:

1978

Language:

english

File:

PDF, 1.05 MB

english, 1978

12

Comparison of Measurement Techniques for Linewidth Metrology on Advanced Photomasks

Smith, Stewart, Tsiamis, Andreas, McCallum, Martin, Hourd, Andrew C., Stevenson, J. T. M., Walton, Anthony J., Dixson, Ronald G., Allen, Richard A., Potzick, James E., Cresswell, Michael W., Orji, Ndu

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2009

Language:

english

File:

PDF, 896 KB

english, 2009

13

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Single crystal critical dimension reference materials (SCCDRM): process optimization for the next generation of standards

Dixson, Ronald G., Archie, Chas N., Guthrie, William F., Cresswell, Michael, Allen, Richard A., Orji, Ndubuisi G.

Year:

2007

Language:

english

File:

PDF, 174 KB

english, 2007

14

Estimating the Impact of Projected Climate Change on Runoff across the Tropical Savannas and Semiarid Rangelands of Northern Australia

Petheram, Cuan, Rustomji, Paul, McVicar, Tim R., Cai, WenJu, Chiew, Francis H. S., Vleeshouwer, Jamie, Van Niel, Thomas G., Li, LingTao, Cresswell, Richard G., Donohue, Randall J., Teng, Jin, Perraud,

Journal:

Journal of Hydrometeorology

Year:

2012

Language:

english

File:

PDF, 3.54 MB

english, 2012

15

Reference-length shortening by Kelvin voltage taps in linewidth test structures replicated in mono-crystalline silicon films

William E. Lee, William F. Guthrie, Michael W. Cresswell, Richard A. Allen, Jeffry J. Sniegowski, Loren W. Linholm

Journal:

Computer Standards & Interfaces

Year:

1999

Language:

english

File:

PDF, 34 KB

english, 1999

16

Strategies for an Integrated Approach to Ecologically Sustainable Land Management

Thackway, Richard, Davey, Stuart, Hoare, James, Cresswell, Ian D.

Journal:

Australasian Journal of Environmental Management

Year:

2005

Language:

english

File:

PDF, 222 KB

english, 2005

17

A First Estimate of Ground Water Ages for the Deep Aquifer of the Kathmandu Basin, Nepal, Using the Radioisotope Chlorine-36

Richard G. Cresswell, John Bauld, Gerry Jacobson, Mohan Singh Khadka, Mani Gopal Jha, Minesh Prasad Shrestha, Sushila Regmi

Journal:

Year:

2001

File:

PDF, 1.35 MB

2001

18

Terrestrial vegetation change inferred from n-alkane σ13C analysis in the marine environment

Michael I. Bird, Roger E. Summons, Michael K. Gagan, Zarko Roksandic, Leslie Dowling, John Head, L. Keith Fifield, Richard G. Cresswell, David P. Johnson

Journal:

Geochimica et Cosmochimica Acta

Year:

1995

Language:

english

File:

PDF, 480 KB

english, 1995

19

A participatory modelling approach to define farm-scale effects of reclaimed wastewater irrigation in the Lockyer Valley, Australia

van Opstal, Jonna D., Huibers, Frans P., Cresswell, Richard G.

Journal:

Water International

Year:

2012

Language:

english

File:

PDF, 655 KB

english, 2012

20

SPIE Proceedings [SPIE Microlithography '99 - Santa Clara, CA (Sunday 14 March 1999)] Metrology, Inspection, and Process Control for Microlithography XIII - Intercomparison of SEM, AFM, and electrical linewidths

Villarrubia, John S., Dixson, Ronald G., Jones, Samuel N., Lowney, Jeremiah R., Postek, Jr., Michael T., Allen, Richard A., Cresswell, Michael W., Singh, Bhanwar

Year:

1999

Language:

english

File:

PDF, 3.27 MB

english, 1999

21

Continuity and Change

Kim Bottomly, Peter Cresswell, Richard A. Flavell, Charles A. Janeway Jr., Jordan S. Pober

Journal:

Year:

2000

Language:

english

File:

PDF, 10 KB

english, 2000

22

Satellite observations of sea-surface temperature fronts off the coast of western and southern Australia

Legeckis, Richard, Cresswell, George

Journal:

Deep Sea Research Part A. Oceanographic Research Papers

Year:

1981

Language:

english

File:

PDF, 1.39 MB

english, 1981

23

SPIE Proceedings [SPIE 23rd Annual International Symposium on Microlithography - Santa Clara, CA (Sunday 22 February 1998)] Metrology, Inspection, and Process Control for Microlithography XII - Comparison of properties of electrical test structures patterned in BESOI and SIMOX films for CD reference-material applications

Allen, Richard A., Ghoshtagore, Rathindra N., Cresswell, Michael W., Linholm, Loren W., Sniegowski, Jeffry J., Singh, Bhanwar

Year:

1998

Language:

english

File:

PDF, 2.25 MB

english, 1998

24

Differential transport requirements of HLA and H-2 class I glycoproteins

Jeff Alexander, J. Alan Payne, Richard Murray, Jeffrey A. Frelinger, Peter Cresswell

Journal:

Year:

1989

Language:

english

File:

PDF, 842 KB

english, 1989

25

Airborne electromagnetics supporting salinity and natural resource management decisions at the field scale in Australia

Richard G. Cresswell, Ian C. Mullen, Rob Kingham, Jim Kellett, David L. Dent, Grant L. Jones

Journal:

International Journal of Applied Earth Observation and Geoinformation

Year:

2007

Language:

english

File:

PDF, 2.02 MB

english, 2007

26

Strategies for an Integrated Approach to Ecologically Sustainable Land Management

Thackway, Richard, Davey, Stuart, Hoare, James, Cresswell, Ian D.

Journal:

Australasian Journal of Environmental Management

Year:

2005

Language:

english

File:

PDF, 1.31 MB

english, 2005

27

SPIE Proceedings [SPIE Photonics West 2001 - Electronic Imaging - San Jose, CA (Saturday 20 January 2001)] Practical Holography XV and Holographic Materials VII - Progress and prospects for practical electroholographic display systems

Slinger, Christopher W., Bannister, Robert W., Cameron, Colin D., Coomber, Stuart D., Cresswell, Ian, Hallett, Peter M., Hughes, Jonathon R., Hui, Victor, Jones, John C., Miller, Richard, Minter, Vict

Year:

2001

Language:

english

File:

PDF, 924 KB

english, 2001

28

[AIP CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2007 International Conference on Frontiers of Characterization and Metrology - Gaithersburg, MD (27-29 March 2007)] AIP Conference Proceedings - CD Reference Materials Fabricated on Monolithic 200 mm Wafers for Automated Metrology Tool Applications

Allen, Richard A., Dixson, Ronald G., Cresswell, Michael W., Guthrie, William F., Shulver, Byron J. R., Bunting, A. S., Stevenson, J. T. M., Walton, Anthony J., Seiler, David G., Diebold, Alain C., Mc

Year:

2007

Language:

english

File:

PDF, 1.13 MB

english, 2007

29

SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Microlithography - Santa Clara, CA (Sunday 10 March 1996)] Metrology, Inspection, and Process Control for Microlithography X - Electrical test structures replicated in silicon-on-insulator material

Cresswell, Michael W., Sniegowski, Jeffry J., Ghoshtagore, Rathindra N., Allen, Richard A., Linholm, Loren W., Villarrubia, John S., Jones, Susan K.

Year:

1996

Language:

english

File:

PDF, 1.25 MB

english, 1996

30

[AIP CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2007 International Conference on Frontiers of Characterization and Metrology - Gaithersburg, MD (27-29 March 2007)] AIP Conference Proceedings - Modeling and Analysis of Scatterometry Signatures for Optical Critical Dimension Reference Material Applications

Patrick, Heather J., Germer, Thomas A., Cresswell, Michael W., Allen, Richard A., Dixson, Ronald G., Bishop, Michael, Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner, C. Michael, Herr, D

Year:

2007

Language:

english

File:

PDF, 575 KB

english, 2007

31

Fabrication and Characterization of Patterned Single-Crystal Silicon Nanolines

Li, Bin, Kang, Min K., Lu, Kuan, Huang, Rui, Ho, Paul S., Allen, Richard A., Cresswell, Michael W.

Journal:

Year:

2008

Language:

english

File:

PDF, 395 KB

english, 2008

32

SPIE Proceedings [SPIE Microlithography 2000 - Santa Clara, CA (Sunday 27 February 2000)] Metrology, Inspection, and Process Control for Microlithography XIV - Linewidth measurement intercomparison on a BESOI sample

Villarrubia, John S., Vladar, Andras E., Lowney, Jeremiah R., Postek, Jr., Michael T., Allen, Richard A., Cresswell, Michael W., Ghoshtagore, Rathindra N., Sullivan, Neal T.

Year:

2000

Language:

english

File:

PDF, 2.08 MB

english, 2000

33

SPIE Proceedings [SPIE 27th Annual BACUS Symposium on Photomask Technology - Monterey, CA (Monday 17 September 2007)] Photomask Technology 2007 - Photomask applications of traceable atomic force microscope dimensional metrology at NIST

Dixson, Ronald, Naber, Robert J., Kawahira, Hiroichi, Orji, Ndubuisi G., Potzick, James, Fu, Joseph, Allen, Richard A., Cresswell, Michael, Smith, Stewart, Walton, Anthony J., Tsiamis, Andreas

Year:

2007

Language:

english

File:

PDF, 167 KB

english, 2007

34

[AIP STRESS-INDUCED PHENOMENA IN METALLIZATION: Tenth International Workshop on Stress-Induced Phenomena in Metallization - Austin (Texas) (5–7 November 2008)] AIP Conference Proceedings - Nanoindentation of Si Nanostructures: Buckling and Friction at Nanoscales

Huang, Huai, Li, Bin, Zhao, Qiu, Luo, Zhiquan, Im, Jay, Kang, Min K., Allen, Richard A., Cresswell, Michael W., Huang, Rui, Ho, Paul S., Ho, Paul S., Zschech, Ehrenfried, Ogawa, Shinichi

Year:

2009

Language:

english

File:

PDF, 1.72 MB

english, 2009

35

Precious metal abundances in selected iron meteorites: in-situ AMS measurements of the six platinum-group elements plus gold

Graham C. Wilson, John C. Rucklidge, Linas R. Kilius, Gang-Jian Ding, Richard G. Cresswell

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

1997

Language:

english

File:

PDF, 594 KB

english, 1997

36

Charles A. Janeway, Jr. (1943-2003)

Kim Bottomly, Peter Cresswell, Richard A Flavell, Sankar Ghosh, Jordan S Pober, David G Schatz

Journal:

Year:

2003

Language:

english

File:

PDF, 67 KB

english, 2003

37

SPIE Proceedings [SPIE Microlithography 2000 - Santa Clara, CA (Sunday 27 February 2000)] Metrology, Inspection, and Process Control for Microlithography XIV - Comparison of electrical CD measurements and cross-section lattice-plane counts of submicrometer features replicated in (100) silicon-on-insulator material

Cresswell, Michael W., Bonevich, John E., Headley, Thomas J., Allen, Richard A., Giannuzzi, Lucille A., Everist, Sarah C., Ghoshtagore, Rathindra N., Shea, Patrick J., Sullivan, Neal T.

Year:

2000

Language:

english

File:

PDF, 2.26 MB

english, 2000

38

A Simple and Inexpensive Trap for Catching Downstream Migrants

RICHARD C. CRESSWELL

Journal:

Aquaculture Research

Year:

1977

Language:

english

File:

PDF, 215 KB

english, 1977

39

Hydrogeology of Palm Valley, central Australia; a Pleistocene flora refuge?

John D.H. Wischusen, L.Keith Fifield, Richard G. Cresswell

Journal:

Journal of Hydrology

Year:

2004

Language:

english

File:

PDF, 1.26 MB

english, 2004

40

Distinguishing spallogenic from non-spallogenic carbon in chondrites using gas and temperature separations

Richard G. Cresswell, Roelf P. Beukens, John C. Rucklidge, Yasunori Miura

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

1994

Language:

english

File:

PDF, 408 KB

english, 1994

41

Controlled formation and resistivity scaling of nickel silicide nanolines

Li, Bin, Luo, Zhiquan, Shi, Li, Zhou, JiPing, Rabenberg, Lew, Ho, Paul S, Allen, Richard A, Cresswell, Michael W

Journal:

Year:

2009

Language:

english

File:

PDF, 1.21 MB

english, 2009

42

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - TEM calibration methods for critical dimension standards

Orji, Ndubuisi G., Dixson, Ronald G., Garcia-Gutierrez, Domingo I., Bunday, Benjamin D., Bishop, Michael, Cresswell, Michael W., Allen, Richard A., Allgair, John A., Archie, Chas N.

Year:

2007

Language:

english

File:

PDF, 677 KB

english, 2007

43

Indentation of single-crystal silicon nanolines: Buckling and contact friction at nanoscales

Li, Bin, Zhao, Qiu, Huang, Huai, Luo, Zhiquan, Kang, Min K., Im, Jang-Hi, Allen, Richard A., Cresswell, Michael W., Huang, Rui, Ho, Paul S.

Journal:

Journal of Applied Physics

Year:

2009

Language:

english

File:

PDF, 1.40 MB

english, 2009

44

Cost and impact of policies to remove and reduce fees for obstetric care in Benin, Burkina Faso, Mali and Morocco

Witter, S., Boukhalfa, C., Cresswell, J. A., Daou, Z., Filippi, V., Ganaba, R., Goufodji, S., Lange, I. L., Marchal, B., Richard, F.

Journal:

International Journal for Equity in Health

Year:

2016

File:

PDF, 2.69 MB

2016

45

BOXIT—A Randomised Phase III Placebo-controlled Trial Evaluating the Addition of Celecoxib to Standard Treatment of Transitional Cell Carcinoma of the Bladder (CRUK/07/004)

Kelly, John D., Tan, Wei Shen, Porta, Nuria, Mostafid, Hugh, Huddart, Robert, Protheroe, Andrew, Bogle, Richard, Blazeby, Jane, Palmer, Alison, Cresswell, Jo, Johnson, Mark, Brough, Richard, Madaan, S

Journal:

European Urology

Year:

2018

Language:

english

File:

PDF, 979 KB

english, 2018

46

Inventories and mobilization of unsaturated zone sulfate, fluoride, and chloride related to land use change in semiarid regions, southwestern United States and Australia

Scanlon, Bridget R., Stonestrom, David A., Reedy, Robert C., Leaney, Fred W., Gates, John, Cresswell, Richard G.

Journal:

Water Resources Research

Year:

2009

Language:

english

File:

PDF, 634 KB

english, 2009

47

Photoactivated 8-methoxypsoralen (8-MOPa)-induced augmentation of the MHC class I antigen processing pathway

Hanlon, Douglas, Cresswell, Peter, Berger, Carole, Edelson, Richard

Journal:

Journal of Dermatological Science

Year:

1998

Language:

english

File:

PDF, 155 KB

english, 1998

48

A new concept in data acquisition electronics, control, and monitoring for the next generation of nuclear gamma ray spectrometer

Ender, C., Beck, F.A., Ring, C., Wendling, L., Richard, A., Aleonard, M.M., Lazarus, I., Pucknell, V., Cresswell, J.R., Nolan, P.J., Holm, A., Kluge, H., Maier, K.H., Ziem, P., Gast, W., Kossionides,

Journal:

IEEE Transactions on Nuclear Science

Year:

1990

Language:

english

File:

PDF, 525 KB

english, 1990

49

SPIE Proceedings [SPIE 26th Annual BACUS Symposium on Photomask Technology - Monterey, CA (Monday 18 September 2006)] Photomask Technology 2006 - A new critical dimension metrology for chrome-on-glass substrates based on s-parameter measurements extracted from coplanar waveguide test structures

Nwokoye, Chidubem A., Martin, Patrick M., Naber, Robert J., Zaghloul, Mona, Cresswell, Michael W., Allen, Richard A., Murabito, Christine E.

Year:

2006

Language:

english

File:

PDF, 175 KB

english, 2006

50

Radiocarbon Dating of Iron Artifacts

Cresswell, Richard G.

Journal:

Year:

1992

Language:

english

File:

PDF, 1009 KB

english, 1992

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